In this presentation, an overview and update of a compact laser setup for generating Single Event Effects (SEE) of cosmic radiation is presented. After my talk at OSCW'17, many new features were developed and will be addressed. Especially the Laser-Scanning-Microscope functionality opens the door for generating SEE with a known absolute position on the chip. The attached pictures show a surface scan of a MSP430 microcontroller as well as a memory map of the ADC-registers in the same controller. The map is generated by overlaying Single Event Upset (SEU - flipped bit) positions above a scanned picture. This might be very helpful for software failure injection testing, as we discovered regions, where more than one bit flips when one position is hit. Beside that, for example sensitivity maps can be generated. The colourful picture shows the area of a memory bit flipped with different laser intensities. Similar investigations are currently ongoing with Single Event Latchups (SEL).
I plan to publish the project open source.